Title: Scanning Probe Microscopy Based Characterization of Semiconductor Nanostructures
Speaker:Associate Prof. Christian Teichert (University of Leoben, Austria)
Time: 14:00, Aug. 25, 2010
Venue: Academic Salon, Institute of Semiconductors, CAS
Abstract: The Scanning Probe Microscopy group at the Institute of Physics of the University of Leoben focuses its efforts on the morphological and electrical characterization of semiconductor nanostructures by means of atomic-force microscopy (AFM). We explore growth mechanisms and self-organization processes in both, inorganic and organic semiconductor thin films. For electrical characterization on the nanometer scale, we employ conductive atomic-force microscopy (C-AFM). These studies include investigations of dielectric thin films as well as organic and inorganic semiconductor layers and free standing ZnO nanorods.
About speaker：
Prof. Christian Teichert was born in 1960 in Halle/Saale, Germany. From 1985 to 2001 he was Research Scientist in Institute of Solid State Physics and Electron Microscopy; Max Planck Institute of Microstructure Physics, Halle, Germany; Institut für Grenzfl？chenforschung and Vakuumphysik, Research Center Jülich, Germany; Department of Materials Science and Engineering, UW-Madison, USA; Max Planck Institute of Microstructure Physics, Max Planck Institute of Microstructure Physics, Halle, Germany. From Oct 2001 to now he is an Associate Professor in Materials Physics, Head of Scanning Probe Microscopy Group, Institute of Physics, Montanuniversit？t Leoben, Austria. His Research interests: Self-organization of inorganic semiconductor nanostructures in heteroepitaxy and under ion erosion; pattern formation and growth modes in crystalline organic thin films; magnetic nanostructures on self-organized substrates; nanometer scale investigation of the electrical properties of dielectric and piezoelectric thin films; scanning probe miroscopy investigations of surface roughness from hard coatings to biomaterials, correlation between nanomorphology and wetting behavior of solid surfaces. Publications: 100 publications in scientific journals that have been cited 2600 times, h-factor 20, 5 book chapters, 2 patents, 35 invited talks at international conferences, 85 invited lectures at universities and research institutions.