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The 306th: Understanding the semiconductor nanostructures using advanced electron microscopy
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Update time: 2017-07-12
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Title: Understanding the semiconductor nanostructures using advanced electron microscopy

Speaker: Prof. Jin Zou (University of Queensland,Australia)

Time: Sept. 27, 2017 10:00AM

Venue:Academic Conference Center, IOS, CAS

Abstract: Semiconductor nanostructures have been paid extraordinary attention in recent years due to their unique structural and chemical characteristics and in turn potential properties in optoelectronic, nanoelectronic, and renewable energy. Advanced electron microscopy has been considered as a unique tool in understanding the morphological, structural and chemical characteristics of nanostructures. In this presentation, through correlating detailed characterization using advanced electron microscopy with nanostructure growth and their demonstrated properties, I shall summarize our recent progress in understanding the semiconductor nanostructures using advanced electron microscopy.

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